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闫爱斌


发表日期:2017-03-28 供稿:管理员

姓名: 闫爱斌

性别:

出生年月:19833

导师类别:博导、硕导

专业技术职称:副教授

招生专业代码及名称:0812计算机、0854电子信息(学术型、专业型)

联系方式:abyan@mail.ustc.edu.cn    QQ: 10254566

研究方向: 宇航芯片冗余容错

(1) 评估数字系统软错误率的软件开发(C++编程)

(2) 可信微型存储部件的仿真与设计(EDA编程)

(3) 高鲁棒性航天嵌入式微系统设计(Verilog编程)

闫爱斌,男,山东德州人。08年先后赴日本神奈川、東京六本木实习,09年获得中国科学技术大学工程硕士学位。09年至12年,先后在上海思华科技、科大国创软件公司担任软件研发工程师、项目组长等职务,软件开发与项目管理经验丰富。15年获得合肥工业大学工学博士学位。16年加入安徽大学。18年至19年国家公派(留学)访问日本。曾担任国际学术会议ATS18宣传主席和程序委员会委员。现担任国家自然科学基金项目函评专家、中国计算机学会容错计算专业委员会委员、以及国际权威期刊如IEEE Trans. on Industrial Electronics,IEEE Trans. on Emerging Topics in Computing,IEEE Trans. on VLSI Systems,IEEE Trans. on Nanotechnology,IEEE Trans. on Device and Materials Reliability的审稿专家。先后与日本法国等建立长期深入而稳定的合作关系,可与国外教授(IEEE Fellow)联合培养博士生。

科研成果

(一)近年来发表的期刊与会议论文列表(节选20篇、一作)

  1. Aibin Yan, Yuanjie Hu, et al, "Information Assurance through Redundant Design: A Novel TNU Error-Resilient Latch…,"
    IEEE Transactions on Computers, 2020. 中科院分区(下同)大类二区. CCF A. 计科领域国际顶级期刊.

  2. Aibin Yan, Xiangfeng Feng, et al, "Design of a Triple-Node-Upset Self-Recoverable Latch for Aerospace Applications…,"
    IEEE Transactions on Aerospace and Electronic Systems, 2020. 小类一区. 宇航电子领域国际顶级期刊.

  3. Aibin Yan, Yan Chen, et al, "Design of Double-Upset Recoverable and Transient-Pulse Filterable Latches…,"
    IEEE Transactions on Aerospace and Electronic Systems, pp. 1-12, 2020. 同上.

  4. Aibin Yan, Zhelong Xu, et al, "A Novel Low-Cost TMR-Without-Voter Based HIS-Insensitive and MNU-Tolerant Latch Design…,"
    IEEE Transactions on Aerospace and Electronic Systems, pp. 1-10, 2019. 同上.

  5. Aibin Yan, Yafei Ling, et al, Quadruple Cross-Coupled Dual-Interlocked-Storage-Cells based Multiple-Node-Upset-Tolerant Latch
    IEEE Transactions on Circuits and Systems I: Regular Papers, 2020. 大类一区. 电路系统领域国际顶级期刊.

  6. Aibin Yan, Yan Chen, et al, "Novel Speed-and-Power-Optimized SRAM Cell Designs with Enhanced Self-Recoverability from …,"
    IEEE Transactions on Circuits and Systems I: Regular Papers, 2020. 同上.

  7. Aibin Yan, Zhen Wu, et al, "Novel Double-Node-Upset-Tolerant Memory Cell Designs Through Radiation-Hardening-by-Design…,"
    IEEE Transactions on Reliability
    , vol. 68, no. 1, pp. 354-363, 2019. 大类二区. 可靠性领域国际顶级期刊.

  8. Aibin Yan, Zhelong Xu, et al, "Novel Quadruple-Node-Upset-Tolerant Latch Designs with Optimized Overhead in Harsh Radiation…,"
    IEEE Transactions on Emerging Topics in Computing, 2020. 18/19大类二区. 前沿计算领域国际著名期刊. Minor Revision.

  9. Aibin Yan, Kang Yang, et al, "A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power…,"
    IEEE Transactions on Circuits and Systems II: Express Briefs, 2019. 大类二区. 电路系统领域国际著名期刊.

  10. Aibin Yan, Chaoping Lai, et al, "Novel Low Cost, Double-and-Triple-Node-Upset-Tolerant Latch Designs for Nano-scale CMOS,"
    IEEE Transactions on Emerging Topics in Computing, pp. 1-14, 2018. 18/19大类二区. 前沿计算领域国际著名期刊.

  11. Aibin Yan, Zhengfeng Huang, et al, "Double-Node-Upset-Resilient Latch Design for Nanoscale CMOS Technology," 
    IEEE Transactions on Very Large Scale Integration Systems, 2017. 大类二区. CCF B. VLSI设计领域国际著名期刊.

  12. Aibin Yan, Xiangfeng Feng, et al, "HITTSFL: Design of a Cost-Effective HIS-Insensitive TNU-Tolerant and SET-Filtering Latch…," 
    IEEE Design Automation Conference, Oral, 2020/7/19-23, 美国旧金山. CCF A. 体系结构领域国际顶级会议.

  13. Aibin Yan, Yan Chen, et al, "N-1 Errors Interceptive Multiple-Modular-Redundancy Voter Designs for Safety-Critical Applications,"
    IEEE Design Automation Conference, Poster, pp. 1-6, 2020/7/19-23. CCF A. 同上.

  14. Aibin Yan, Yuanjie Hu, et al, "Single-Event Double-Upset Self-Recoverable and Single-Event Transient Pulse Filterable Latch…,"
    IEEE Design, Automation and Test in EuropeConference, Oral, pp. 1-6, 2019/3/25-29, 意大利佛罗轮萨. CCF B.

  15. Aibin Yan, Yan Chen, et al, "TNUINC: Triple-Node-Upset-Immune Nano-scale CMOS Latch Design for Aerospace Applications,"
    IEEE International Conference on Computer Design, Poster, pp. 1-6, 2019/11/17-20, 阿拉伯阿布扎比. CCF B.

  16. Aibin Yan, Xuejun Li, et al. "High performance, low cost, and double node upset tolerant latch design," 
    IEEE International Conference on Dependable Systems and Networks, Fast Abstract, 2016/6/28-2016/7/1, 法国图卢兹. CCF B.

  17. Aibin Yan, Zhelong Xu, et al, "Dual-Interlocked-Storage-Cell-Based Double-Node-Upset Self-Recoverable Flip-Flop Design…," 
    IEEE International Symposium on Circuits and Systems, 2020/5/17-20, 西班牙塞维利亚. 电路系统领域国际顶级会议.

  18. Aibin Yan, Zhengfeng Huang, et al, "HLDTL: High-performance, low-cost, and double node upset tolerant latch design," 
    IEEE VLSI Test Symposium
    , pp. 1-6, 2017/4/9-12. 美国拉斯维加斯.

  19. Aibin Yan, Zhengfeng Huang, et al, "Novel low cost and double node upset tolerant latch design for nanoscale CMOS technology,"
    IEEE Asian Test Symposium, pp. 1-6, 2016/11/21-24. 日本广岛.

  20. Aibin Yan, Huaguo Liang, et al, "An SEU resilient, SET filterable and cost effective latch in presence of PVT variations,"
    Microelectronics Reliability, vol. 63, no. 1, pp. 239-250, 2016.

(二)近年来申请/授权的国家发明专利列表(节选10件)

1.闫爱斌, 唐锡铭, , "一种容忍任意三节点翻转并过滤瞬态脉冲的锁存器", 申请号: 2019108097440

2.闫爱斌, 冯祥凤, , "一种N-1级故障过滤表决器", 申请号: 201910702101.6

3.闫爱斌, 胡元节, , "一种任意三节点翻转完全自恢复的锁存器", 申请号: 201910218107.6

4.闫爱斌, 吴珍, , "一种三个内部节点翻转完全免疫的锁存器," 申请号: 201810015566.X

5.闫爱斌, 崔杰, 易茂祥, 黄正峰, "高性能低开销的双节点翻转在线自恢复锁存器," 申请号: 201710022408.2

6.闫爱斌, 王华彬, 黄正峰, 易茂祥, "高性能低开销的单粒子翻转在线自恢复锁存器," 申请号: 201611217325.0

7.梁华国, 闫爱斌, , "一种延缓老化并容忍软错误的集成电路选择性加固方法," 申请号: 201510181497.6

8.黄正峰, …, 闫爱斌, , "一种基于延时单元的自恢复抗单粒子锁存器结构," 申请号: 201510969497.2

9.黄正峰, …, 闫爱斌, , "一种基于双模冗余的抗单粒子多节点翻转加固锁存器," 申请号: 201510969571.0

10.欧阳一鸣, …, 闫爱斌, "片上网络中新颖的故障与拥塞模型下的容错方法," 已授权, ZL201410833884.9

在研项目

  1. 国家自然科学基金面上项目, “抗单粒子多节点翻转与多瞬态的加固单元设计研究,” 编号61974001, 2020.1-2023.12, 项目负责人/主持人.

  2. 国家自然科学基金青年项目, “纳米集成电路软错误率评估关键技术研究”, 编号61604001, 2017.1-2019.12, 项目负责人/主持人.

  3. 国家自然科学基金青年项目, “无防篡改设备的高效车载自组网隐私保护关键技术研究”, 编号61702005, 2018.1-2020.12, 项目参与人.

  4. 国家自然科学基金面上项目, “星载系统芯片(SoC)的抗辐射加固设计研究”, 编号61574052, 2016.1-2019.12, 项目参与人.

获奖情况

CTC2018学术会议最佳论文奖

安徽省“挑战杯”大学生课外学术科技作品竞赛特等奖(指导教师)

全国“挑战杯”大学生课外学术科技作品竞赛三等奖(指导教师)


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